Purchase your copy of ASTM E – 02() as a PDF download or hard copy directly from the official BSI Shop. All BSI British Standards. Find the most up-to-date version of ASTM E at Engineering ASTM E – E – 02 The test methods provide for reporting of specic, distinctive informati.
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Current results may be erased by clicking on the “Erase Current Results” button. The operator may edit individual images allowing accurate measurements to be made even on difficult samples.
Then use the planimeter to measure the area enclosed within each outlined region. Also use the planimeter to measure the total area of the image. Use the lowest magnication that e1811 visual resolution of the coarse- and ne-grained areas as distinct regions. Such outlining will simplify decisions during point counting, and thus speed the counting process.
Duplex grain structures for example, multiphase alloys are not necessarily duplex in grain size, and as such are not the subject of these methods.
Each photomicrograph is accompanied 1e181 the corresponding reporting format for that type of duplex grain size. Any of the Intercept Procedures of E may be used, within the regions of distinct grain size.
Count the number of grid points falling within e111 particular grain size region being evaluated. Results are also sent to an Excel spreadsheet – “Grainrpt.
ASTM E1181 – 02(2015)
The test grid consists of a square network of grid lines, with a recommended interline spacing of 5 mm. If microscopic examination is subsequently necessary, individual specimens must be taken to allow estimation of area fractions for the entire product cross-section, and to allow determination of grain sizes representing the entire cross-section as well. Examples of random duplex grain sizes include: The area fraction occupied by the ne grain asm calculated as the total intercept length in the ne grain region Examples of topological duplex grain sizes include: All results may be erased by clicking on the “Erase All Results” button.
An example photomicrograph of the bimodal condition appears in Fig. No other units of measurement are included in this standard. The distribution of intercept lengths is much more efficiently determined using a semi-automated image analysis system with a digitizing tablet and electronic pencil or cursor, or using an automated image analysis system with electronic pencil or cursor. The percent of the total intercept length represented by the intercept length in each class interval was then calculated by dividing each value in the seventh column by the total intercept length This comparison chart is shown in Fig.
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Use one of the procedures from 8. The histogram suggests that the specimen evaluated contains more than a single distribution of grain sizes. To characterize these patterns accurately, the entire cross-section of the specimen or product must be evaluated.
The operator can set any size field area using the Set Field button.
ASTM E – 02 Standard Test Methods for Characterizing Duplex Grain Sizes
The area occupied by the ne grains is what must be determined. An example of such a histogram is shown in Fig.
Such a method is subject to considerable error. The grid should consist of equally spaced points formed by the intersection of ne lines.
If there is any doubt whether a point falls inside or outside the outlined region, count the point as one half. Users of this standard are expressly advised that determination of the validity of any such patent rights, and the risk of infringement of such rights, are entirely their own responsibility.
A tube whose wall thickness is small compared to its outside diameter may be treated as equivalent to a product of rectangular cross-section, in that a surface layer of a given depth at 5 the outside diameter covers essentially the same area as a layer of the same depth at the inside diameter. For comparison of mechanical properties with metallurgical features, or for specication purposes, it may be important to be able to characterize grain size in such materials.
For the coarse grain, the corresponding intercept length of An example of a complete report might read: One, the Direct Measurement Procedure see 8.